Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides chemical information of sample surfaces and has extremely high sensitivity and high spatial resolution (approximately 100 nm). And, it can detect less than one molecular layer.
We have been working on the application of ToF-SIMS to complex samples such as bio-devices, plant and animal tissues, organic-inorganic materials and nanomaterials and development of data analysis techniqeus for ToF-SIMS.
Near Field Infrared Spectroscopy (NFIR) enables high spatial resolution mapping (several 100 nm) beyond the wavelength limitation. Combination of NFIR and ToF-SIMS provides detailed information of complex samples.
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides chemical information of sample surfaces and has extremely high sensitivity and high spatial resolution (approximately 100 nm). And, it can detect less than one molecular layer. 
Near Field Infrared Spectroscopy (NFIR) enables high spatial resolution mapping (several 100 nm) beyond the wavelength limitation. Combination of NFIR and ToF-SIMS provides detailed information of complex samples.