The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-13)

Scope:
SISS-13 will cover SIMS and related techniques based on ion-solid interactions: fundamentals, instrumentation, and application in various fields, such as semiconductors, industrial materials, biological, medical, and environmental sciences. This symposium will be held as a pre-conference of SIMS-XVIII. In this time, we will have mainly three sessions: Atom Probe, D-SIMS, and TOF-SIMS.

Date: June 23 and 24, 2011    9:00-18:00

Place: Meeting Room on the 4th floor, University Building #14, Seikei University, Tokyo
(Social meeting: June 23, 2011 at evening, Hall on the 12th floor, University Building #10)

Registration will be opened by March.

Guideline for presenters:
All invited and contributed presenters are expected to write abstracts. Please send a MS-Word or PDF file of your abstract (A4 page size, no page limitation) to the committee by e-mail, no later than May 1st, 2011. The abstract should be accompanied by a cover letter stating the title, name, address, e-mail address.

If you would prefer an oral presentation, please let us know by February 1st, 2011!

Contact us:Organizing Committee Dr. Satoka Aoyagi(Shimane University)
E-mail: aoyagi*life.shimane-u.ac.jp (Please replace ''*' to '@' in the address.)

Committee: